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Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing)

by Angela Krstic,Kwang-Ting (Tim) Cheng

ISBN 13: 9780792382959

Format: Hardcover (208 pages)
Publisher: Springer
Published: 31 Oct 1998

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Delay Fault Testing for VlSi Circuits: 14 (Frontiers in Electronic Testing)

by Angela Krstic,. Kwang-Ting(Tim)Cheng

ISBN 13: 9781461375616

Format: Paperback (208 pages)
Publisher: Springer
Published: 31 Oct 1998

Save for later